Click on page icon to navigate Table of Contents IRAM BRASS Test Chip Testing Plan LowSwing DriverReceiver (LG Semicon) Tester Hardware Platform IRAM Ring, DRAM SRAM (LG Semicon) Trumpet (Light): BRASS HSRA embedded DRAM (LG Semicon) Gigabit/sec Serial I/O (MOSIS) PCIBased Host Tester Power Supply LowSwing DriverReceivers Test Adapter IRAM Ring, DRAM and SRAM Test Adapter BRASS HSRA Embedded DRAM Test Adapter Tester Baseboard PCIBased Host Driver Glossary D.U.T. Board or Custom Test Chip Adapters Logic Analyzer Software Interface Software Integration and User Interface Design Interface and File Formats Test Chip Designs Gigabit/sec Serial I/O Test Adapter Custom Test Chip Adapters Tester Software D.U.T. Power Supplies D.U.T. Adjustable Frequency Clock JTAG Serial Interface Temperature Monitor and Control Status and Control Bits Parallel 32b Data Path Mechanical Layout Xilinx Controller Testing Plan Overview Serial I/O Test Chip Pin Listing Data Requirements Tester Capabilities Tester Control Example IRAM Ring Chip Packaging Socketing Whats New Log of changes to testing plan. Logic Analyzer Voltage Set Registers Voltage Measure Registers Current Measure Memory Clock Control Register JTAG Control Register Temperature Monitor/Control Register Status/Control Register Parallel 32b Data Register Digital Sampling Oscilloscope IRAM Test Chip Trumpet: Xilinx Interface Overview Trumpet Timing Diagrams Trumpet Test Chip Signals Xilinx Refresh FSM